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Testsystem_for_the_RC703.pdf

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   BitStore.Metadata_version:
   	1.0
  
   BitStore.Access:
   	public
  
   BitStore.Filename:
   	Testsystem_for_the_RC703.pdf
  
   BitStore.Size:
   	917254
  
   BitStore.Format:
   	PDF
  
   BitStore.Ident:
   	30005352:1
  
   BitStore.Digest:
   	sha256:f5ffcf7267bd5bdb26febddfcf83d676a44137202cb08650ce83c0b14abefbed
  
   BitStore.Last_edit:
   	20230721 Søren.Roug
  
   DDHF.Keyword:
   	RC/RC700/HW
   	RCSL/44/RT
  
   Document.Title:
   	Testsystem for the RC703 Version 1.1 User's Guide
  
   Document.RCSL:
   	RCSL-44-RT-2072
  
   Document.Author:
   	Steen Nørgaard
   	Jan Nielsen
  
   Document.Date:
   	September 1983
  
   Document.Description:
   	This manual describes the testsystem and the testprograms version 1.1
   	for the RC703 Piccolo.
   	The testprograms described in this manual are: the ram test, the ram
   	controller test, the dma test, the ctc test, the fdc test, the pio
   	test, the sio test, the fdd test, the wic test, the fdd reliability
   	test, the crt test, and the wid reliability test.
  
   *END*

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• Bits:Keyword/RC/RC700/HW ‎ (← henvisninger)
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